DPU Chart: Selecting the Chart Type

On the chart Views tab, select whether you want to see a DPU chart with or without a user-specified improvement line, a Yield chart, a Cost chart, a Statistics list, a Data table or Defect detail. You can select any combination of these options.

If you draw more than one chart, the program displays them on the screen in a cascade. You can then maximize one and minimize the others to view the charts individually.

The views listed here give you information in either a chart or table:

Charts

What information it contains

Defects Per Unit (DPU)

Displays defect levels of your process(es) over time.

DPU Improvement

Displays defect levels of your process(es) over time against a user-specified improvement curve. Default improvement curve is 10x, a value which can be modified in the Administration module. For example, a 10x-improvement curve represents a goal of reducing defects by 10 times in two years and 100 times in four years.

Yield

Displays yield levels of your processes over time. This shows you how the percentage of good units changes over time.

Cost

Displays the cost of defects or defective units over time. The way that costs are calculated will depend on the Use cost information from setting on Step 4.

 

Tables

What information it contains

Statistics list

A table displaying statistics you have chosen as relevant for your data.

Data table

Shows the data used to create the chart:

  • Date and time

  • Part number

  • Process

  • Sample size

  • Nonconforming units

  • Defects

  • Percent of sample

  • Special

  • Lot #*

  • Shift*

  • Department*

  • Machine*

  • Cavity*

  • Operator*

  • Event

* Your traceability labels may differ and you may use up to 42 additional traceability fields.

Defect detail list

Contains the information that goes into making the plot point for a chart:

  • Defects

  • % of defects

  • % of total sample size

  • Cost

  • % of defect cost

  • % of total cost

  • PPM

  • Sigma

  • NCU

  • % of total NCU

  • Yield

  • Sample size